2
RF Device Data
Freescale Semiconductor
MRF7S21080HR3 MRF7S21080HSR3
Table 3. ESD Protection Characteristics
Test Methodology
Class
Human Body Model (per JESD22--A114)
1C (Minimum)
Machine Model (per EIA/JESD22--A115)
A (Minimum)
Charge Device Model (per JESD22--C101)
IV (Minimum)
Table 4. Electrical Characteristics
(TA
=25°C unless otherwise noted)
Characteristic
Symbol
Min
Typ
Max
Unit
Off Characteristics
Zero Gate Voltage Drain Leakage Current
(VDS
=65Vdc,VGS
=0Vdc)
IDSS
?
?
10
μAdc
Zero Gate Voltage Drain Leakage Current
(VDS
=28Vdc,VGS
=0Vdc)
IDSS
?
?
1
μAdc
Gate--Source Leakage Current
(VGS
=5Vdc,VDS
=0Vdc)
IGSS
?
?
1
μAdc
On Characteristics
Gate Threshold Voltage
(VDS
=10Vdc,ID
= 174
μAdc)
VGS(th)
1.5
2
3
Vdc
Gate Quiescent Voltage
(VDS
=28Vdc,ID
= 800 mAdc)
VGS(Q)
?
2.7
?
Vdc
Fixture Gate Quiescent Voltage
(1)
(VDD
=28Vdc,ID
= 800 mAdc, Measured in Functional Test)
VGG(Q)
4
5.5
7
Vdc
Drain--Source On--Voltage
(VGS
=10Vdc,ID
=1.74Adc)
VDS(on)
0.1
0.2
0.3
Vdc
Dynamic Characteristics
(2)
Reverse Transfer Capacitance
(VDS
=28Vdc±
30 mV(rms)ac @ 1 MHz, VGS
=0Vdc)
Crss
?
0.64
?
pF
Output Capacitance
(VDS
=28Vdc±
30 mV(rms)ac @ 1 MHz, VGS
=0Vdc)
Coss
?
296
?
pF
Input Capacitance
(VDS
=28Vdc,VGS
=0Vdc±
30 mV(rms)ac @ 1 MHz)
Ciss
?
160
?
pF
Functional Tests
(In Freescale Test Fixture, 50 ohm system) VDD
=28Vdc,IDQ
= 800 mA, Pout
= 22 W Avg., f = 2167.5 MHz,
Single--Carrier W--CDMA, IQ Magnitude Clipping, PAR = 7.5 dB @ 0.01% Probability on CCDF. ACPR measured in 3.84 MHz Channel
Bandwidth @
±5MHzOffset.
Power Gain
Gps
16.5
18
19.5
dB
Drain Efficiency
ηD
30
32
?
%
Output Peak--to--Average Ratio @ 0.01% Probability on CCDF
PAR
5.7
6.5
?
dB
Adjacent Channel Power Ratio
ACPR
?
-- 3 8
-- 3 5
dBc
Input Return Loss
IRL
?
-- 1 6
-- 9
dB
1. VGG
=2xVGS(Q). Parameter measured on Freescale Test Fixture, due to resistive divider network on the board. Refer to Test Circuit
schematic.
2. Part internally matched both on input and output.
(continued)
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